The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Two mechanisms of data retention (DR) are investigated on logic embedded non-volatile memory (eNVM) in Multiple-Time-Programming (MTP) application. Unlike the typically observed DR degradation after endurance test in flash memory, DR window closure of logic eNVM can be recovered at higher data retention bake temperature and longer bake time due to thermally activated electron de-trapping from interface...
Flash pitch scaling will lead to cells for which the wordline no longer fits between the floating gates, which results in loss of sidewall coupling, causing unacceptable program saturation due to IPD leakage. We present a dual layer poly/metal floating gate (FG) memory device avoiding this saturation and demonstrate +4V programming above the fresh level in a fully planar cell without sidewall coupling...
We propose one novel approach on engineering floating gate (FG) of Flash memory cell: carbon incorporation into polysilicon FG. This technique demonstrated improvement in retention and larger program/erase Vth window, especially for smaller capacitance coupling ratio cell which is important for future scaled Flash memory cells.
The reliability of advanced embedded non-volatile memories has been discussed using the 2T-FNFN devices example. The write/erase endurance and the data retention are the most important reliability parameters. The intrinsic reliability mechanisms can be addressed through single cell evaluation, while the cell-to-cell variation determines the product level reliability. The cell-to-cell variation can...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.